Electronic display measurement : concepts, techniques and instrumentation / Peter A. Keller.
Material type:
- 0471148571
- 621.38154220287 KEL 1997
Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
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PERPUSTAKAAN POLITEKNIK SULTAN SALAHUDDIN ABDUL AZIZ SHAH | 621.38154220287 KEL 1997 (Browse shelf(Opens below)) | 17105 | Available | 0000018185 | |
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PERPUSTAKAAN POLITEKNIK SULTAN SALAHUDDIN ABDUL AZIZ SHAH | 621.38154220287 KEL 1997 (Browse shelf(Opens below)) | 17106 | Available | 0000018186 | |
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PERPUSTAKAAN POLITEKNIK SULTAN SALAHUDDIN ABDUL AZIZ SHAH | 621.38154220287 KEL 1997 (Browse shelf(Opens below)) | 17107 | Available | 0000018187 |
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621.3815422 YEH 1999 Optics of liquid crystal displays | 621.3815422 YEH 1999 Optics of liquid crystal displays | 621.38154220287 KEL 1997 Electronic display measurement : concepts, techniques and instrumentation | 621.38154220287 KEL 1997 Electronic display measurement : concepts, techniques and instrumentation | 621.38154220287 KEL 1997 Electronic display measurement : concepts, techniques and instrumentation | 621.381548 AFS 1995 Principles of semiconductor network testing | 621.381548 BAH 2010 Wafer-level testing and test during burn-in for integrated circuits |
Includes index
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